A general on-wafer noise figure de-embedding technique with gain uncertainty analysis

A Flexible Microwave De-Embedding Method for On-Wafer Noise Parameter Characterization of MOSFETs

A flexible noise de-embedding method for on-wafer microwave measurements of silicon MOSFETs is presented in this study. We use the open, short, and thru dummy structures to subtract the parasitic effects from the probe pads and interconnects of a fixtured MOS transistor. The thru standard are used to extract the interconnect parameters for subtracting the interconnect parasitics in gate, drain,...

Optimizing On-Wafer Noise Figure Measurements up to 67 GHz

Two techniques are commonly used to measure NF: the Y-factor method and the cold-source method. The Y-factor or hot/ cold-source method is the predominant approach and is most commonly implemented with noise-figure analyzers and spectrum analyzer-based solutions. In contrast, the cold-source method is usually performed using vector network analyzers (VNAs), which provide magnitude and phase inf...

A 1.2 V Low-Noise-Amplifier with Double Feedback for High Gain and Low Noise Figure

Faculdade de Ciências e Tecnologia Departamento de Engenharia Eletrotécnica e de Computadores Mestrado Integrado em Engenharia Eletrotécnica e de Computadores por David Jorge Tiago Amoêdo In this thesis we present a balun low noise amplifier (LNA) in which the gain is boosted using a double feedback structure. The circuit is based in a Balun LNA with noise and distortion cancellation. The LNA i...

A thru-only de-embedding method for on-wafer characterization of multiport networks

A Four-Step Method for De-Embedding Gigahertz On-Wafer CMOS Measurements

In this paper, a de-embedding method is proposed for conducting accurate on-wafer device measurements in the gigahertz range. The method addresses issues of substrate coupling and contact effects and is therefore suitable for measurements with lossy technologies such as CMOS. The method assumes a probe-tip two-port calibration performed with well-known techniques and impedance substrates. By em...